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1
Reeder, Harry L.
| P & R Pub |
2004
253-R327f
253-R327f
2
Reed, David A.
| Baker Book House |
1990
289.920216-R323i-R
289.920216-R323i-R
3
Farkas, John R.
| Baker Book House |
1995
289.332-F229m
289.332-F229m
5
Augsburger, David W.
| Moody Press |
2000
234.5-A921n3
234.5-A921n3
6
![Three-Dimensional Phase Contrast Electron Tomography for Multiple Scattering Samples- [electronic resource]](/Sponge/Images/bookDefaults/DDbookdefaultsmall.png)
Ren, Yonghuan David.Electrical Engineering & Compu
| University of California, Berkeley. |
2021
7
Ren, Yonghuan David.Electrical Engineering & Compu
| University of California, Berkeley. |
2021
8
Ren, Yonghuan David.Electrical Engineering & Compu
| University of California, Berkeley. |
2021
Trier
Affiner
Format
Auteur
- Ren, Yonghuan David.Electrical Engineering & Compu (3+)
- Reed, David A. (2+)
- Reeder, Harry L. (1+)
- Farkas, John R. (1+)
- Augsburger, David W. (1+)
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année
Langue