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Machine Learning Techniques for Rare Failure Detection in Analog and Mixed-Signal Verification and Test
Machine Learning Techniques for Rare Failure Detection in Analog and Mixed-Signal Verifica...
Machine Learning Techniques for Rare Failure Detection in Analog and Mixed-Signal Verification and Test

Detailed Information

자료유형  
 학위논문파일 국외
최종처리일시  
20220210094238
ISBN  
9798492753658
DDC  
621.3
저자명  
Hu, Hanbin.
서명/저자  
Machine Learning Techniques for Rare Failure Detection in Analog and Mixed-Signal Verification and Test
발행사항  
[Sl] : University of California, Santa Barbara, 2021
발행사항  
Ann Arbor : ProQuest Dissertations & Theses, 2021
형태사항  
192 p
주기사항  
Source: Dissertations Abstracts International, Volume: 83-05, Section: B.
주기사항  
Advisor: Li, Peng.
학위논문주기  
Thesis (Ph.D.)--University of California, Santa Barbara, 2021.
사용제한주기  
This item must not be sold to any third party vendors.
일반주제명  
Computer engineering
일반주제명  
Artificial intelligence
일반주제명  
Computer science
키워드  
Analog and mixed-signal test
키워드  
Analog and mixed-signal verification
키워드  
Bayesian optimization
키워드  
Failure detection
키워드  
Machine learning
키워드  
Self-supervised learning
기타저자  
University of California, Santa Barbara Electrical & Computer Engineering
기본자료저록  
Dissertations Abstracts International. 83-05B.
기본자료저록  
Dissertation Abstract International
전자적 위치 및 접속  
로그인 후 원문을 볼 수 있습니다.

MARC

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■020    ▼a9798492753658
■035    ▼a(MiAaPQ)AAI28718099
■040    ▼aMiAaPQ▼cMiAaPQ
■0820  ▼a621.3
■1001  ▼aHu,  Hanbin.
■24510▼aMachine  Learning  Techniques  for  Rare  Failure  Detection  in  Analog  and  Mixed-Signal  Verification  and  Test
■260    ▼a[Sl]▼bUniversity  of  California,  Santa  Barbara▼c2021
■260  1▼aAnn  Arbor▼bProQuest  Dissertations  &  Theses▼c2021
■300    ▼a192  p
■500    ▼aSource:  Dissertations  Abstracts  International,  Volume:  83-05,  Section:  B.
■500    ▼aAdvisor:  Li,  Peng.
■5021  ▼aThesis  (Ph.D.)--University  of  California,  Santa  Barbara,  2021.
■506    ▼aThis  item  must  not  be  sold  to  any  third  party  vendors.
■590    ▼aSchool  code:  0035.
■650  4▼aComputer  engineering
■650  4▼aArtificial  intelligence
■650  4▼aComputer  science
■653    ▼aAnalog  and  mixed-signal  test
■653    ▼aAnalog  and  mixed-signal  verification
■653    ▼aBayesian  optimization
■653    ▼aFailure  detection
■653    ▼aMachine  learning
■653    ▼aSelf-supervised  learning
■690    ▼a0464
■690    ▼a0800
■690    ▼a0984
■71020▼aUniversity  of  California,  Santa  Barbara▼bElectrical  &  Computer  Engineering.
■7730  ▼tDissertations  Abstracts  International▼g83-05B.
■773    ▼tDissertation  Abstract  International
■790    ▼a0035
■791    ▼aPh.D.
■792    ▼a2021
■793    ▼aEnglish
■85640▼uhttp://www.riss.kr/pdu/ddodLink.do?id=T16054363▼nKERIS▼z이  자료의  원문은  한국교육학술정보원에서  제공합니다.
■980    ▼a202202▼f2022

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