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Applied Numerical Methods in Characterizing Optical Nanomaterials and Nanostructures
Applied Numerical Methods in Characterizing Optical Nanomaterials and Nanostructures
상세정보
- 자료유형
- 학위논문파일 국외
- 최종처리일시
- 20220210094557
- ISBN
- 9798535589442
- DDC
- 530
- 서명/저자
- Applied Numerical Methods in Characterizing Optical Nanomaterials and Nanostructures
- 발행사항
- [Sl] : The Pennsylvania State University, 2020
- 발행사항
- Ann Arbor : ProQuest Dissertations & Theses, 2020
- 형태사항
- 142 p
- 주기사항
- Source: Dissertations Abstracts International, Volume: 83-03, Section: B.
- 주기사항
- Advisor: Liu, Zhiwen.
- 학위논문주기
- Thesis (Ph.D.)--The Pennsylvania State University, 2020.
- 일반주제명
- Physics
- 일반주제명
- Collaboration
- 일반주제명
- Spectrum analysis
- 일반주제명
- Power
- 일반주제명
- Topography
- 일반주제명
- Carbon
- 일반주제명
- Electric fields
- 일반주제명
- Microscopy
- 일반주제명
- Silver
- 일반주제명
- Classification
- 일반주제명
- Numerical analysis
- 일반주제명
- Measurement techniques
- 일반주제명
- Nanomaterials
- 일반주제명
- Optical properties
- 일반주제명
- Methods
- 일반주제명
- Graphene
- 일반주제명
- Optics
- 일반주제명
- Geometry
- 일반주제명
- Nanotechnology
- 일반주제명
- Electrical engineering
- 일반주제명
- Applied physics
- 키워드
- Refractive index
- 키워드
- Layer thickness
- 키워드
- Machine learning
- 기본자료저록
- Dissertations Abstracts International. 83-03B.
- 기본자료저록
- Dissertation Abstract International
- 전자적 위치 및 접속
- 로그인 후 원문을 볼 수 있습니다.
MARC
008220131s2020 us c eng d■001000016054973
■00520220210094557
■020 ▼a9798535589442
■035 ▼a(MiAaPQ)AAI28767669
■040 ▼aMiAaPQ▼cMiAaPQ
■0820 ▼a530
■1001 ▼aNoble, Joshua Alton.
■24510▼aApplied Numerical Methods in Characterizing Optical Nanomaterials and Nanostructures
■260 ▼a[Sl]▼bThe Pennsylvania State University▼c2020
■260 1▼aAnn Arbor▼bProQuest Dissertations & Theses▼c2020
■300 ▼a142 p
■500 ▼aSource: Dissertations Abstracts International, Volume: 83-03, Section: B.
■500 ▼aAdvisor: Liu, Zhiwen.
■5021 ▼aThesis (Ph.D.)--The Pennsylvania State University, 2020.
■590 ▼aSchool code: 0176.
■650 4▼aPhysics
■650 4▼aCollaboration
■650 4▼aSpectrum analysis
■650 4▼aPower
■650 4▼aTopography
■650 4▼aCarbon
■650 4▼aElectric fields
■650 4▼aMicroscopy
■650 4▼aChemical vapor deposition
■650 4▼aSilver
■650 4▼aClassification
■650 4▼aNumerical analysis
■650 4▼aMeasurement techniques
■650 4▼aNanomaterials
■650 4▼aOptical properties
■650 4▼aMethods
■650 4▼aGraphene
■650 4▼aResearch & development--R&D
■650 4▼aOptics
■650 4▼aGeometry
■650 4▼aNanotechnology
■650 4▼aElectrical engineering
■650 4▼aApplied physics
■653 ▼aCharacterization of 2D materials
■653 ▼aUltrafast, nonlinear, and holographic microscopy
■653 ▼aRefractive index
■653 ▼aLayer thickness
■653 ▼aOptical pulse reconstruction
■653 ▼aMachine learning
■653 ▼aNear-field scanning optical microscopy
■690 ▼a0752
■690 ▼a0605
■690 ▼a0544
■690 ▼a0652
■690 ▼a0215
■71020▼aThe Pennsylvania State University.
■7730 ▼tDissertations Abstracts International▼g83-03B.
■773 ▼tDissertation Abstract International
■790 ▼a0176
■791 ▼aPh.D.
■792 ▼a2020
■793 ▼aEnglish
■85640▼uhttp://www.riss.kr/pdu/ddodLink.do?id=T16054973▼nKERIS▼z이 자료의 원문은 한국교육학술정보원에서 제공합니다.
■980 ▼a202202▼f2022
