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Sensing Gamma-Rays in Thick Pixelated Thallium Bromide Detectors With Application-Specific Integrated Circuits
Sensing Gamma-Rays in Thick Pixelated Thallium Bromide Detectors With Application-Specific...
Sensing Gamma-Rays in Thick Pixelated Thallium Bromide Detectors With Application-Specific Integrated Circuits

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자료유형  
 학위논문 서양
최종처리일시  
20250211153146
ISBN  
9798384044871
DDC  
539.76
저자명  
Hall, Erik.
서명/저자  
Sensing Gamma-Rays in Thick Pixelated Thallium Bromide Detectors With Application-Specific Integrated Circuits
발행사항  
[Sl] : University of Michigan, 2024
발행사항  
Ann Arbor : ProQuest Dissertations & Theses, 2024
형태사항  
116 p
주기사항  
Source: Dissertations Abstracts International, Volume: 86-03, Section: B.
주기사항  
Advisor: He, Zhong.
학위논문주기  
Thesis (Ph.D.)--University of Michigan, 2024.
초록/해제  
요약Pixelated semiconductor gamma-ray detectors are uniquely suited to perform both gamma-ray spectrometry and imaging with the same device. These detectors can precisely record the energy deposited by an incident gamma ray and their planar-pixel electrode configuration enables three-dimensional position-sensing of the interaction. CZT has demonstrated great commercial success and research materials such as TlBr and Perovskites, such as cesium-lead bromide, have potential as alternatives to CZT. However, readout electronics and algorithms that can mate with these new materials are key components to their radiation detection capability. This work seeks to identify the gaps in the fabrication of pixelated TlBr gamma-ray detectors, using current readout technology and techniques, and suggests areas for further development.Electrodes made from various combinations of materials to include chromium, gold, palladium, and platinum provided the best spectroscopic performance. However, their performance generally worsened over time. Some samples showed a small improvement later, but not enough for their further use as gamma-ray detectors. Electrode refabrication failed to provide good results later, so electrode materials are likely diffusing into the detector bulk. Additionally, a small detector with thallium electrodes provided similarly good performance until failure, then was operated with a reverse-polarity positive bias for a similar time period. When tested again with a negative bias, it showed good performance again similar to its operation before failure.In larger detectors bonded to a carrier board, over days of operation, some event waveform tails show an increasing amount of extra signal, which degrades spectroscopic resolution. Events occurring near the pixel edges tend to show this extra tail signal while event waveforms in the pixel center tend to have a more consistent shape. Increased electron de-trapping around the pixel edges is a possible cause. A pixel-like pattern has also been observed on their planar cathodes, where patches of the cathode have disintegrated. It is possible that the silver epoxy used to bond the pixelated anode of the detectors to their carrier board is reacting with the planar cathode and causing the separation. The VAD-UMv2.2 ASIC is failing to record many events at its smallest dynamic range. This problem is exacerbated for detectors with greater electron trapping. Failure to record events in sub-optimal detectors makes characterization difficult or impossible. Increasing the preamplifier feedback resistance enabled the recording of more events in the middle depths, but events near the planar cathode were still missing. When using the smallest dynamic range, this ASIC's trigger shaper likely has a time constant that is too short for slow-rising waveforms in lower-mobility materials like TlBr. However, this ASIC's second-smallest dynamic range seemed to be better able to record more bulk events, even near the planar cathode. Another disadvantage is that its sampling window at a 2.5 MHz sampling rate is barely long enough to fully record events in TlBr at more sustainable operating biases like 1 kV/cm. The slowest sampling rate of 1.25 MHz would be beneficial for recording complete event waveforms but was not functioning. The H3DD-UMv4 ASIC is more suitable than the VAD-UMv2.2 ASIC for slower materials such as TlBr. It has more reliable slow sampling rates, a longer sampling window, and a wider span of trigger shaping times. It's slower trigger shaper time constant enables the recording of more low-amplitude events, which helps correctly categorize multi-pixel events and thus improves the energy resolution for single-pixel events.One detector showed consistent performance when operated from 0°C to +30°C. However, and extra signal loss was observed repeatedly at +40°C. Faster preamplifier decay at +40°C played a role in that signal loss.
일반주제명  
Nuclear engineering
일반주제명  
Electrical engineering
키워드  
Thallium bromide
키워드  
Pixelated semiconductor
키워드  
Waveform signal processing
키워드  
Gamma-ray spectrometry
기타저자  
University of Michigan Nuclear Engineering & Radiological Sciences
기본자료저록  
Dissertations Abstracts International. 86-03B.
전자적 위치 및 접속  
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MARC

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■020    ▼a9798384044871
■035    ▼a(MiAaPQ)AAI31631415
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■0820  ▼a539.76
■1001  ▼aHall,  Erik.
■24510▼aSensing  Gamma-Rays  in  Thick  Pixelated  Thallium  Bromide  Detectors  With  Application-Specific  Integrated  Circuits
■260    ▼a[Sl]▼bUniversity  of  Michigan▼c2024
■260  1▼aAnn  Arbor▼bProQuest  Dissertations  &  Theses▼c2024
■300    ▼a116  p
■500    ▼aSource:  Dissertations  Abstracts  International,  Volume:  86-03,  Section:  B.
■500    ▼aAdvisor:  He,  Zhong.
■5021  ▼aThesis  (Ph.D.)--University  of  Michigan,  2024.
■520    ▼aPixelated  semiconductor  gamma-ray  detectors  are  uniquely  suited  to  perform  both  gamma-ray  spectrometry  and  imaging  with  the  same  device.  These  detectors  can  precisely  record  the  energy  deposited  by  an  incident  gamma  ray  and  their  planar-pixel  electrode  configuration  enables  three-dimensional  position-sensing  of  the  interaction.  CZT  has  demonstrated  great  commercial  success  and  research  materials  such  as  TlBr  and  Perovskites,  such  as  cesium-lead  bromide,  have  potential  as  alternatives  to  CZT.  However,  readout  electronics  and  algorithms  that  can  mate  with  these  new  materials  are  key  components  to  their  radiation  detection  capability.  This  work  seeks  to  identify  the  gaps  in  the  fabrication  of  pixelated  TlBr  gamma-ray  detectors,  using  current  readout  technology  and  techniques,  and  suggests  areas  for  further  development.Electrodes  made  from  various  combinations  of  materials  to  include  chromium,  gold,  palladium,  and  platinum  provided  the  best  spectroscopic  performance.  However,  their  performance  generally  worsened  over  time.  Some  samples  showed  a  small  improvement  later,  but  not  enough  for  their  further  use  as  gamma-ray  detectors.  Electrode  refabrication  failed  to  provide  good  results  later,  so  electrode  materials  are  likely  diffusing  into  the  detector  bulk.  Additionally,  a  small  detector  with  thallium  electrodes  provided  similarly  good  performance  until  failure,  then  was  operated  with  a  reverse-polarity  positive  bias  for  a  similar  time  period.  When  tested  again  with  a  negative  bias,  it  showed  good  performance  again  similar  to  its  operation  before  failure.In  larger  detectors  bonded  to  a  carrier  board,  over  days  of  operation,  some  event  waveform  tails  show  an  increasing  amount  of  extra  signal,  which  degrades  spectroscopic  resolution.  Events  occurring  near  the  pixel  edges  tend  to  show  this  extra  tail  signal  while  event  waveforms  in  the  pixel  center  tend  to  have  a  more  consistent  shape.  Increased  electron  de-trapping  around  the  pixel  edges  is  a  possible  cause.  A  pixel-like  pattern  has  also  been  observed  on  their  planar  cathodes,  where  patches  of  the  cathode  have  disintegrated.  It  is  possible  that  the  silver  epoxy  used  to  bond  the  pixelated  anode  of  the  detectors  to  their  carrier  board  is  reacting  with  the  planar  cathode  and  causing  the  separation. The  VAD-UMv2.2  ASIC  is  failing  to  record  many  events  at  its  smallest  dynamic  range.  This  problem  is  exacerbated  for  detectors  with  greater  electron  trapping.  Failure  to  record  events  in  sub-optimal  detectors  makes  characterization  difficult  or  impossible.  Increasing  the  preamplifier  feedback  resistance  enabled  the  recording  of  more  events  in  the  middle  depths,  but  events  near  the  planar  cathode  were  still  missing.  When  using  the  smallest  dynamic  range,  this  ASIC's  trigger  shaper  likely  has  a  time  constant  that  is  too  short  for  slow-rising  waveforms  in  lower-mobility  materials  like  TlBr.  However,  this  ASIC's  second-smallest  dynamic  range  seemed  to  be  better  able  to  record  more  bulk  events,  even  near  the  planar  cathode.  Another  disadvantage  is  that  its  sampling  window  at  a  2.5  MHz  sampling  rate  is  barely  long  enough  to  fully  record  events  in  TlBr  at  more  sustainable  operating  biases  like  1  kV/cm.  The  slowest  sampling  rate  of  1.25  MHz  would  be  beneficial  for  recording  complete  event  waveforms  but  was  not  functioning. The  H3DD-UMv4  ASIC  is  more  suitable  than  the  VAD-UMv2.2  ASIC  for  slower  materials  such  as  TlBr.  It  has  more  reliable  slow  sampling  rates,  a  longer  sampling  window,  and  a  wider  span  of  trigger  shaping  times.  It's  slower  trigger  shaper  time  constant  enables  the  recording  of  more  low-amplitude  events,  which  helps  correctly  categorize  multi-pixel  events  and  thus  improves  the  energy  resolution  for  single-pixel  events.One  detector  showed  consistent  performance  when  operated  from  0°C  to  +30°C.  However,  and  extra  signal  loss  was  observed  repeatedly  at  +40°C.  Faster  preamplifier  decay  at  +40°C  played  a  role  in  that  signal  loss.
■590    ▼aSchool  code:  0127.
■650  4▼aNuclear  engineering
■650  4▼aElectrical  engineering
■653    ▼aThallium  bromide
■653    ▼aPixelated  semiconductor
■653    ▼aWaveform  signal  processing
■653    ▼aGamma-ray  spectrometry
■690    ▼a0552
■690    ▼a0544
■71020▼aUniversity  of  Michigan▼bNuclear  Engineering  &  Radiological  Sciences.
■7730  ▼tDissertations  Abstracts  International▼g86-03B.
■790    ▼a0127
■791    ▼aPh.D.
■792    ▼a2024
■793    ▼aEnglish
■85640▼uhttp://www.riss.kr/pdu/ddodLink.do?id=T17165190▼nKERIS▼z이  자료의  원문은  한국교육학술정보원에서  제공합니다.

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