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Solar-Blind Deep UV AlGaN Based Avalanche Photodetectors for Single Photon Detection
Solar-Blind Deep UV AlGaN Based Avalanche Photodetectors for Single Photon Detection
Solar-Blind Deep UV AlGaN Based Avalanche Photodetectors for Single Photon Detection

상세정보

자료유형  
 학위논문 서양
최종처리일시  
20250211150922
ISBN  
9798381976748
DDC  
621.3
저자명  
Gautam, Lakshay.
서명/저자  
Solar-Blind Deep UV AlGaN Based Avalanche Photodetectors for Single Photon Detection
발행사항  
[Sl] : Northwestern University, 2024
발행사항  
Ann Arbor : ProQuest Dissertations & Theses, 2024
형태사항  
161 p
주기사항  
Source: Dissertations Abstracts International, Volume: 85-10, Section: B.
주기사항  
Advisor: Razeghi, Manijeh.
학위논문주기  
Thesis (Ph.D.)--Northwestern University, 2024.
초록/해제  
요약The study of III-Nitride-based optoelectronics devices is a maturing field with the advent of blue/white LEDs, finding various applications in industry. However, there are still many underdeveloped areas to contribute to new and original research. This work explicitly targets the goals of realizing solar-blind avalanche photodetectors with single photon detection capabilities. Achieving these goals has required systematic optimization of the material growth and characterization, device modeling and design, device fabrication and processing, and device testing. This work describes the research conducted and presents relevant devices results.The AlGaN material system has a tunable direct bandgap that is ideally suited to detection of ultraviolet light; however, this material system suffers from several key issues, making realization of high-efficiency photodetectors complex: large dislocation densities, low n-type and p-type doping efficiency, and lattice and thermal expansion mismatches leading to cracking of the material. These problems are exacerbated by the increased aluminum compositions necessary in back-illuminated and solar-blind devices. Overcoming these obstacles has required extensive development and optimization of the material growth techniques necessary, including everything from the growth of the buffer and template to the growth of the active region.For the first time, the devices realized in this work demonstrate high gain deep UV avalanche photodetectors showing single photon detection capabilities in the solar-blind region. We report gain in excess of 50,000 with a single photon detection efficiency of 5% at 255 nm. This serves as the foundation to realize solar-blind APD arrays with high single photon detection efficiencies. Since dislocation densities arising from the lattice mismatch drive up the dark current and reduce performance of these devices, two approaches were explored to reduce the defect densities in the active AlGaN layers. First, the use of AlN substrates was studied.This work demonstrates low dark current, deep Ultraviolet AlGaN/AlN Photodetectors on AlN substrate. AlGaN based Photodetectors are grown and fabricated both on AlN and Sapphire substrates with the same epilayer structure. Subsequently, electrical characteristics of both photodetectors on AlN substrate and Sapphire are compared. A reduction of 4 orders of magnitude of dark current density is reported in UV detectors grown on AlN substrate with respect to Sapphire substrate. However, no avalanche effects was observed due to impurity related absorptions in the AlN substrate. Therefore, a novel method of epitaxy, namely, Reduced Area Epitaxy (RAE) was employed to demonstrate array based format of avalanche photodetectors in the Deep UV region by reduction of cracks in the active AlGaN layers for detectors grown on Sapphire.This work reports high gain avalanche photodetectors operating in the deep UV wavelength regime. The high gain was leveraged through reduced area epitaxy by patterning AlN on Sapphire substrate. This helps in a substantial reduction of crack formation due to overgrowth on individually isolated AlN mesas. Reproducible gain on the order of 105 was reported for multiple diodes in different areas of 320x256 focal plane array. Therefore, the next step would be to implement these devices in a focal plane array format which will pave the way for commercial realization of back-illuminated avalanche photodetectors in the deep UV region.
일반주제명  
Electrical engineering
일반주제명  
Engineering
일반주제명  
Applied physics
일반주제명  
Quantum physics
키워드  
Avalanche photodetectors
키워드  
Gallium nitride
키워드  
Semiconductors
키워드  
Single photon detection
키워드  
Solid-state physics
기타저자  
Northwestern University Electrical and Computer Engineering
기본자료저록  
Dissertations Abstracts International. 85-10B.
전자적 위치 및 접속  
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MARC

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■1001  ▼aGautam,  Lakshay.
■24510▼aSolar-Blind  Deep  UV  AlGaN  Based  Avalanche  Photodetectors  for  Single  Photon  Detection
■260    ▼a[Sl]▼bNorthwestern  University▼c2024
■260  1▼aAnn  Arbor▼bProQuest  Dissertations  &  Theses▼c2024
■300    ▼a161  p
■500    ▼aSource:  Dissertations  Abstracts  International,  Volume:  85-10,  Section:  B.
■500    ▼aAdvisor:  Razeghi,  Manijeh.
■5021  ▼aThesis  (Ph.D.)--Northwestern  University,  2024.
■520    ▼aThe  study  of  III-Nitride-based  optoelectronics  devices  is  a  maturing  field  with  the  advent  of  blue/white  LEDs,  finding  various  applications  in  industry.  However,  there  are  still  many  underdeveloped  areas  to  contribute  to  new  and  original  research.  This  work  explicitly  targets  the  goals  of  realizing  solar-blind  avalanche  photodetectors  with  single  photon  detection  capabilities.  Achieving  these  goals  has  required  systematic  optimization  of  the  material  growth  and  characterization,  device  modeling  and  design,  device  fabrication  and  processing,  and  device  testing.  This  work  describes  the  research  conducted  and  presents  relevant  devices  results.The  AlGaN  material  system  has  a  tunable  direct  bandgap  that  is  ideally  suited  to  detection  of  ultraviolet  light;  however,  this  material  system  suffers  from  several  key  issues,  making  realization  of  high-efficiency  photodetectors  complex:  large  dislocation  densities,  low  n-type  and  p-type  doping  efficiency,  and  lattice  and  thermal  expansion  mismatches  leading  to  cracking  of  the  material.  These  problems  are  exacerbated  by  the  increased  aluminum  compositions  necessary  in  back-illuminated  and  solar-blind  devices.  Overcoming  these  obstacles  has  required  extensive  development  and  optimization  of  the  material  growth  techniques  necessary,  including  everything  from  the  growth  of  the  buffer  and  template  to  the  growth  of  the  active  region.For  the  first  time,  the  devices  realized  in  this  work  demonstrate  high  gain  deep  UV  avalanche  photodetectors  showing  single  photon  detection  capabilities  in  the  solar-blind  region.  We  report  gain  in  excess  of  50,000  with  a  single  photon  detection  efficiency  of  5%  at  255  nm.  This  serves  as the  foundation  to  realize  solar-blind  APD  arrays  with  high  single  photon  detection  efficiencies.  Since  dislocation  densities  arising  from  the  lattice  mismatch  drive  up  the  dark  current  and  reduce  performance  of  these  devices,  two  approaches  were  explored  to  reduce  the  defect  densities  in  the  active  AlGaN  layers.  First,  the  use  of  AlN  substrates  was  studied.This  work  demonstrates  low  dark  current,  deep  Ultraviolet  AlGaN/AlN  Photodetectors  on  AlN  substrate.  AlGaN  based  Photodetectors  are  grown  and  fabricated  both  on  AlN  and  Sapphire  substrates  with  the  same  epilayer  structure.  Subsequently,  electrical  characteristics  of  both  photodetectors  on  AlN  substrate  and  Sapphire  are  compared.  A  reduction  of  4  orders  of  magnitude  of  dark  current  density  is  reported  in  UV  detectors  grown  on  AlN  substrate  with  respect  to  Sapphire  substrate.  However,  no  avalanche  effects  was  observed  due  to  impurity  related  absorptions  in  the  AlN  substrate.  Therefore,  a  novel  method  of  epitaxy,  namely,  Reduced  Area  Epitaxy  (RAE)  was  employed  to  demonstrate  array  based  format  of  avalanche  photodetectors  in  the  Deep  UV  region  by  reduction  of  cracks  in  the  active  AlGaN  layers  for  detectors  grown  on  Sapphire.This  work  reports  high  gain  avalanche  photodetectors  operating  in  the  deep  UV  wavelength  regime.  The  high  gain  was  leveraged  through  reduced  area  epitaxy  by  patterning  AlN  on  Sapphire  substrate.  This  helps  in  a  substantial  reduction  of  crack  formation  due  to  overgrowth  on  individually  isolated  AlN  mesas.  Reproducible  gain  on  the  order  of  105  was  reported  for  multiple  diodes  in  different  areas  of  320x256  focal  plane  array.  Therefore,  the  next  step  would  be  to  implement  these  devices  in  a  focal  plane  array  format  which  will  pave  the  way  for  commercial  realization  of  back-illuminated  avalanche  photodetectors  in  the  deep  UV  region.
■590    ▼aSchool  code:  0163.
■650  4▼aElectrical  engineering
■650  4▼aEngineering
■650  4▼aApplied  physics
■650  4▼aQuantum  physics
■653    ▼aAvalanche  photodetectors
■653    ▼aGallium  nitride
■653    ▼aSemiconductors
■653    ▼aSingle  photon  detection
■653    ▼aSolid-state  physics
■690    ▼a0544
■690    ▼a0537
■690    ▼a0599
■690    ▼a0215
■71020▼aNorthwestern  University▼bElectrical  and  Computer  Engineering.
■7730  ▼tDissertations  Abstracts  International▼g85-10B.
■790    ▼a0163
■791    ▼aPh.D.
■792    ▼a2024
■793    ▼aEnglish
■85640▼uhttp://www.riss.kr/pdu/ddodLink.do?id=T17160159▼nKERIS▼z이  자료의  원문은  한국교육학술정보원에서  제공합니다.

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