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Solar-Blind Deep UV AlGaN Based Avalanche Photodetectors for Single Photon Detection
Solar-Blind Deep UV AlGaN Based Avalanche Photodetectors for Single Photon Detection
상세정보
- 자료유형
- 학위논문 서양
- 최종처리일시
- 20250211150922
- ISBN
- 9798381976748
- DDC
- 621.3
- 저자명
- Gautam, Lakshay.
- 서명/저자
- Solar-Blind Deep UV AlGaN Based Avalanche Photodetectors for Single Photon Detection
- 발행사항
- [Sl] : Northwestern University, 2024
- 발행사항
- Ann Arbor : ProQuest Dissertations & Theses, 2024
- 형태사항
- 161 p
- 주기사항
- Source: Dissertations Abstracts International, Volume: 85-10, Section: B.
- 주기사항
- Advisor: Razeghi, Manijeh.
- 학위논문주기
- Thesis (Ph.D.)--Northwestern University, 2024.
- 초록/해제
- 요약The study of III-Nitride-based optoelectronics devices is a maturing field with the advent of blue/white LEDs, finding various applications in industry. However, there are still many underdeveloped areas to contribute to new and original research. This work explicitly targets the goals of realizing solar-blind avalanche photodetectors with single photon detection capabilities. Achieving these goals has required systematic optimization of the material growth and characterization, device modeling and design, device fabrication and processing, and device testing. This work describes the research conducted and presents relevant devices results.The AlGaN material system has a tunable direct bandgap that is ideally suited to detection of ultraviolet light; however, this material system suffers from several key issues, making realization of high-efficiency photodetectors complex: large dislocation densities, low n-type and p-type doping efficiency, and lattice and thermal expansion mismatches leading to cracking of the material. These problems are exacerbated by the increased aluminum compositions necessary in back-illuminated and solar-blind devices. Overcoming these obstacles has required extensive development and optimization of the material growth techniques necessary, including everything from the growth of the buffer and template to the growth of the active region.For the first time, the devices realized in this work demonstrate high gain deep UV avalanche photodetectors showing single photon detection capabilities in the solar-blind region. We report gain in excess of 50,000 with a single photon detection efficiency of 5% at 255 nm. This serves as the foundation to realize solar-blind APD arrays with high single photon detection efficiencies. Since dislocation densities arising from the lattice mismatch drive up the dark current and reduce performance of these devices, two approaches were explored to reduce the defect densities in the active AlGaN layers. First, the use of AlN substrates was studied.This work demonstrates low dark current, deep Ultraviolet AlGaN/AlN Photodetectors on AlN substrate. AlGaN based Photodetectors are grown and fabricated both on AlN and Sapphire substrates with the same epilayer structure. Subsequently, electrical characteristics of both photodetectors on AlN substrate and Sapphire are compared. A reduction of 4 orders of magnitude of dark current density is reported in UV detectors grown on AlN substrate with respect to Sapphire substrate. However, no avalanche effects was observed due to impurity related absorptions in the AlN substrate. Therefore, a novel method of epitaxy, namely, Reduced Area Epitaxy (RAE) was employed to demonstrate array based format of avalanche photodetectors in the Deep UV region by reduction of cracks in the active AlGaN layers for detectors grown on Sapphire.This work reports high gain avalanche photodetectors operating in the deep UV wavelength regime. The high gain was leveraged through reduced area epitaxy by patterning AlN on Sapphire substrate. This helps in a substantial reduction of crack formation due to overgrowth on individually isolated AlN mesas. Reproducible gain on the order of 105 was reported for multiple diodes in different areas of 320x256 focal plane array. Therefore, the next step would be to implement these devices in a focal plane array format which will pave the way for commercial realization of back-illuminated avalanche photodetectors in the deep UV region.
- 일반주제명
- Electrical engineering
- 일반주제명
- Engineering
- 일반주제명
- Applied physics
- 일반주제명
- Quantum physics
- 키워드
- Gallium nitride
- 키워드
- Semiconductors
- 기타저자
- Northwestern University Electrical and Computer Engineering
- 기본자료저록
- Dissertations Abstracts International. 85-10B.
- 전자적 위치 및 접속
- 로그인 후 원문을 볼 수 있습니다.
MARC
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■00520250211150922
■006m o d
■007cr#unu||||||||
■020 ▼a9798381976748
■035 ▼a(MiAaPQ)AAI30820281
■040 ▼aMiAaPQ▼cMiAaPQ
■0820 ▼a621.3
■1001 ▼aGautam, Lakshay.
■24510▼aSolar-Blind Deep UV AlGaN Based Avalanche Photodetectors for Single Photon Detection
■260 ▼a[Sl]▼bNorthwestern University▼c2024
■260 1▼aAnn Arbor▼bProQuest Dissertations & Theses▼c2024
■300 ▼a161 p
■500 ▼aSource: Dissertations Abstracts International, Volume: 85-10, Section: B.
■500 ▼aAdvisor: Razeghi, Manijeh.
■5021 ▼aThesis (Ph.D.)--Northwestern University, 2024.
■520 ▼aThe study of III-Nitride-based optoelectronics devices is a maturing field with the advent of blue/white LEDs, finding various applications in industry. However, there are still many underdeveloped areas to contribute to new and original research. This work explicitly targets the goals of realizing solar-blind avalanche photodetectors with single photon detection capabilities. Achieving these goals has required systematic optimization of the material growth and characterization, device modeling and design, device fabrication and processing, and device testing. This work describes the research conducted and presents relevant devices results.The AlGaN material system has a tunable direct bandgap that is ideally suited to detection of ultraviolet light; however, this material system suffers from several key issues, making realization of high-efficiency photodetectors complex: large dislocation densities, low n-type and p-type doping efficiency, and lattice and thermal expansion mismatches leading to cracking of the material. These problems are exacerbated by the increased aluminum compositions necessary in back-illuminated and solar-blind devices. Overcoming these obstacles has required extensive development and optimization of the material growth techniques necessary, including everything from the growth of the buffer and template to the growth of the active region.For the first time, the devices realized in this work demonstrate high gain deep UV avalanche photodetectors showing single photon detection capabilities in the solar-blind region. We report gain in excess of 50,000 with a single photon detection efficiency of 5% at 255 nm. This serves as the foundation to realize solar-blind APD arrays with high single photon detection efficiencies. Since dislocation densities arising from the lattice mismatch drive up the dark current and reduce performance of these devices, two approaches were explored to reduce the defect densities in the active AlGaN layers. First, the use of AlN substrates was studied.This work demonstrates low dark current, deep Ultraviolet AlGaN/AlN Photodetectors on AlN substrate. AlGaN based Photodetectors are grown and fabricated both on AlN and Sapphire substrates with the same epilayer structure. Subsequently, electrical characteristics of both photodetectors on AlN substrate and Sapphire are compared. A reduction of 4 orders of magnitude of dark current density is reported in UV detectors grown on AlN substrate with respect to Sapphire substrate. However, no avalanche effects was observed due to impurity related absorptions in the AlN substrate. Therefore, a novel method of epitaxy, namely, Reduced Area Epitaxy (RAE) was employed to demonstrate array based format of avalanche photodetectors in the Deep UV region by reduction of cracks in the active AlGaN layers for detectors grown on Sapphire.This work reports high gain avalanche photodetectors operating in the deep UV wavelength regime. The high gain was leveraged through reduced area epitaxy by patterning AlN on Sapphire substrate. This helps in a substantial reduction of crack formation due to overgrowth on individually isolated AlN mesas. Reproducible gain on the order of 105 was reported for multiple diodes in different areas of 320x256 focal plane array. Therefore, the next step would be to implement these devices in a focal plane array format which will pave the way for commercial realization of back-illuminated avalanche photodetectors in the deep UV region.
■590 ▼aSchool code: 0163.
■650 4▼aElectrical engineering
■650 4▼aEngineering
■650 4▼aApplied physics
■650 4▼aQuantum physics
■653 ▼aAvalanche photodetectors
■653 ▼aGallium nitride
■653 ▼aSemiconductors
■653 ▼aSingle photon detection
■653 ▼aSolid-state physics
■690 ▼a0544
■690 ▼a0537
■690 ▼a0599
■690 ▼a0215
■71020▼aNorthwestern University▼bElectrical and Computer Engineering.
■7730 ▼tDissertations Abstracts International▼g85-10B.
■790 ▼a0163
■791 ▼aPh.D.
■792 ▼a2024
■793 ▼aEnglish
■85640▼uhttp://www.riss.kr/pdu/ddodLink.do?id=T17160159▼nKERIS▼z이 자료의 원문은 한국교육학술정보원에서 제공합니다.


