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Thin Film Grain Growth Studies in the Transmission Electron Microscope: Imaging, Segmentation, and Orientation Mapping
Thin Film Grain Growth Studies in the Transmission Electron Microscope: Imaging, Segmentat...
Thin Film Grain Growth Studies in the Transmission Electron Microscope: Imaging, Segmentation, and Orientation Mapping

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자료유형  
 학위논문 서양
최종처리일시  
20260202105156
ISBN  
9798293884551
DDC  
620.11
저자명  
Patrick, Matthew J.
서명/저자  
Thin Film Grain Growth Studies in the Transmission Electron Microscope: Imaging, Segmentation, and Orientation Mapping
발행사항  
[Sl] : Columbia University, 2025
발행사항  
Ann Arbor : ProQuest Dissertations & Theses, 2025
형태사항  
279 p
주기사항  
Source: Dissertations Abstracts International, Volume: 87-03, Section: B.
주기사항  
Advisor: Barmak, Katayun.
학위논문주기  
Thesis (Ph.D.)--Columbia University, 2025.
초록/해제  
요약The microstructure of polycrystalline materials has well documented impacts on their properties, but process development for controlling grain growth remains empirical. In short, predictive models are limited by the multi-dimensional nature of this ensemble problem and the consequent scarcity of time series data. This dissertation presents developments in transmission electron microscopy (TEM)-based approaches for acquiring and analyzing such data, leveraging thin films' columnar microstructure to study the behavior of microstructures and grain boundaries under geometric constraints and to study the dynamics of grain growth through in situ heating experiments.While in many instances thin films act as a proxy for bulk materials, geometric constraints are found to introduce unexpected behavior with implications for coarsening. In particular, in two experiments it is shown that the dihedral angles at grain boundary triple junctions do not obey the established Herring equilibrium equations relating triple junction geometry and grain boundary energies, pointing to equilibrium effects related to strain, surface energies, and non-equilibrium effects like triple junction drag, which result in measurable deviations in the morphology of the grain boundary network. Furthermore, the large surface energy contributions that lead to the development of [111]-fiber textures in FCC materials impose geometric restrictions on grain boundary character, leading to the favored growth of high relative energy grain boundaries at the expense of lower energy boundaries, in contrast to bulk materials.To the end of achieving complete dynamic characterization of grain growth, the longstanding grain/grain boundary identification problem is addressed for brightfield (BF)-TEM images of polycrystalline films with the introduction of two convolutional neural network (CNN)-based segmentation approaches. These models, benchmarked by physical observables, enable the rapid, high-throughput analysis of the thousands of images acquired during an in situ heating experiment, which would not be possible via previous manual methodologies. Demonstrating the use-case, a special-case BF-TEM imaging mode is employed to capture an evolving microstructure during an in situ heating experiment at high time resolution; the images are analyzed automatically to characterize grain size evolution and identify grains and grain boundaries. These microstructural features are spatially correlated to orientation maps acquired before and after heating, demonstrating a framework for tagging dynamically acquired image data with intermittently collected crystallographic data. Given adequate object tracking, this suggests TEM-based thin film grain growth experiments are a viable platform for a complete and high-time resolution characterization of grain growth.In summary, this dissertation (i) expands our understanding of the effects of thin film geometry on microstructural development, especially with respect to grain boundary character, energy and triple junction behavior, and (ii) develops the software infrastructure and experimental frameworks required for high-throughput TEM-based thin film grain growth studies, establishing an experimental platform for the future development of data-driven models for microstructural evolution.
일반주제명  
Materials science
일반주제명  
Chemistry
일반주제명  
Statistics
일반주제명  
Computational chemistry
키워드  
Grain boundary character
키워드  
Grain growth
키워드  
Microstructure
키워드  
Segmentation
키워드  
Transmission electron microscopy
기타저자  
Columbia University Materials Science and Engineering
기본자료저록  
Dissertations Abstracts International. 87-03B.
전자적 위치 및 접속  
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MARC

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■035    ▼a(MiAaPQ)AAI32243256
■040    ▼aMiAaPQ▼cMiAaPQ
■0820  ▼a620.11
■1001  ▼aPatrick,  Matthew  J.
■24510▼aThin  Film  Grain  Growth  Studies  in  the  Transmission  Electron  Microscope:  Imaging,  Segmentation,  and  Orientation  Mapping
■260    ▼a[Sl]▼bColumbia  University▼c2025
■260  1▼aAnn  Arbor▼bProQuest  Dissertations  &  Theses▼c2025
■300    ▼a279  p
■500    ▼aSource:  Dissertations  Abstracts  International,  Volume:  87-03,  Section:  B.
■500    ▼aAdvisor:  Barmak,  Katayun.
■5021  ▼aThesis  (Ph.D.)--Columbia  University,  2025.
■520    ▼aThe  microstructure  of  polycrystalline  materials  has  well  documented  impacts  on  their  properties,  but  process  development  for  controlling  grain  growth  remains  empirical.  In  short,  predictive  models  are  limited  by  the  multi-dimensional  nature  of  this  ensemble  problem  and  the  consequent  scarcity  of  time  series  data.  This  dissertation  presents  developments  in  transmission  electron  microscopy  (TEM)-based  approaches  for  acquiring  and  analyzing  such  data,  leveraging  thin  films'  columnar  microstructure  to  study  the  behavior  of  microstructures  and  grain  boundaries  under  geometric  constraints  and  to  study  the  dynamics  of  grain  growth  through  in  situ  heating  experiments.While  in  many  instances  thin  films  act  as  a  proxy  for  bulk  materials,  geometric  constraints  are  found  to  introduce  unexpected  behavior  with  implications  for  coarsening.  In  particular,  in  two  experiments  it  is  shown  that  the  dihedral  angles  at  grain  boundary  triple  junctions  do  not  obey  the  established  Herring  equilibrium  equations  relating  triple  junction  geometry  and  grain  boundary  energies,  pointing  to  equilibrium  effects  related  to  strain,  surface  energies,  and  non-equilibrium  effects  like  triple  junction  drag,  which  result  in  measurable  deviations  in  the  morphology  of  the  grain  boundary  network.  Furthermore,  the  large  surface  energy  contributions  that  lead  to  the  development  of  [111]-fiber  textures  in  FCC  materials  impose  geometric  restrictions  on  grain  boundary  character,  leading  to  the  favored  growth  of  high  relative  energy  grain  boundaries  at  the  expense  of  lower  energy  boundaries,  in  contrast  to  bulk  materials.To  the  end  of  achieving  complete  dynamic  characterization  of  grain  growth,  the  longstanding  grain/grain  boundary  identification  problem  is  addressed  for  brightfield  (BF)-TEM  images  of  polycrystalline  films  with  the  introduction  of  two  convolutional  neural  network  (CNN)-based  segmentation  approaches.  These  models,  benchmarked  by  physical  observables,  enable  the  rapid,  high-throughput  analysis  of  the  thousands  of  images  acquired  during  an  in  situ  heating  experiment,  which  would  not  be  possible  via  previous  manual  methodologies.  Demonstrating  the  use-case,  a  special-case  BF-TEM  imaging  mode  is  employed  to  capture  an  evolving  microstructure  during  an  in  situ  heating  experiment  at  high  time  resolution;  the  images  are  analyzed  automatically  to  characterize  grain  size  evolution  and  identify  grains  and  grain  boundaries.  These  microstructural  features  are  spatially  correlated  to  orientation  maps  acquired  before  and  after  heating,  demonstrating  a  framework  for  tagging  dynamically  acquired  image  data  with  intermittently  collected  crystallographic  data.  Given  adequate  object  tracking,  this  suggests  TEM-based  thin  film  grain  growth  experiments  are  a  viable  platform  for  a  complete  and  high-time  resolution  characterization  of  grain  growth.In  summary,  this  dissertation  (i)  expands  our  understanding  of  the  effects  of  thin  film  geometry  on  microstructural  development,  especially  with  respect  to  grain  boundary  character,  energy  and  triple  junction  behavior,  and  (ii)  develops  the  software  infrastructure  and  experimental  frameworks  required  for  high-throughput  TEM-based  thin  film  grain  growth  studies,  establishing  an  experimental  platform  for  the  future  development  of  data-driven  models  for  microstructural  evolution.
■590    ▼aSchool  code:  0054.
■650  4▼aMaterials  science
■650  4▼aChemistry
■650  4▼aStatistics
■650  4▼aComputational  chemistry
■653    ▼aGrain  boundary  character
■653    ▼aGrain  growth
■653    ▼aMicrostructure
■653    ▼aSegmentation
■653    ▼aTransmission  electron  microscopy
■690    ▼a0794
■690    ▼a0219
■690    ▼a0485
■690    ▼a0463
■71020▼aColumbia  University▼bMaterials  Science  and  Engineering.
■7730  ▼tDissertations  Abstracts  International▼g87-03B.
■790    ▼a0054
■791    ▼aPh.D.
■792    ▼a2025
■793    ▼aEnglish
■85640▼uhttp://www.riss.kr/pdu/ddodLink.do?id=T17359673▼nKERIS▼z이  자료의  원문은  한국교육학술정보원에서  제공합니다.

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