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Fabrication and Characterization of Chalcogenide and Oxide Thin Films
Fabrication and Characterization of Chalcogenide and Oxide Thin Films
상세정보
- 자료유형
- 학위논문 서양
- 최종처리일시
- 20260202103017
- ISBN
- 9798286443659
- DDC
- 530
- 저자명
- Pan, Shuhang.
- 서명/저자
- Fabrication and Characterization of Chalcogenide and Oxide Thin Films
- 발행사항
- [Sl] : Yale University, 2025
- 발행사항
- Ann Arbor : ProQuest Dissertations & Theses, 2025
- 형태사항
- 147 p
- 주기사항
- Source: Dissertations Abstracts International, Volume: 86-12, Section: B.
- 주기사항
- Advisor: Ahn, Charles.
- 학위논문주기
- Thesis (Ph.D.)--Yale University, 2025.
- 초록/해제
- 요약This dissertation explores the fabrication, structural characterization, and quantum transport properties of chalcogenide and oxide thin films. High-quality SnTe films were synthesized via molecular beam epitaxy (MBE), demonstrating tunable topological surface states through nanoscale patterning. Magnetoconductivity measurements revealed weak antilocalization (WAL) effects across continuous and patterned films, with coherence lengths governed by boundary scattering in hole-patterned geometries. Advanced focused ion beam (FIB) protocols enabled atomic-resolution transmission electron microscopy (TEM) of monolayer ZrO2 on silicon, defect distribution in off-stoichiometric CaWO4 films and orientation analysis in YVO4 thin films. Josephson junctions fabricated on superconducting Nd1−xEuxNiO2 thin films exhibited macroscopic quantum transport behavior. By integrating nanofabrication with multi-scale characterization, this work establishes design principles for investigating quantum phenomena in low-dimensional systems, advancing applications in topological electronics and superconducting devices.
- 일반주제명
- Condensed matter physics
- 일반주제명
- Molecular physics
- 일반주제명
- Physics
- 일반주제명
- Nanoscience
- 키워드
- Nanofabrication
- 키워드
- Oxide thin film
- 기타저자
- Yale University Physics
- 기본자료저록
- Dissertations Abstracts International. 86-12B.
- 전자적 위치 및 접속
- 로그인 후 원문을 볼 수 있습니다.
MARC
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■00520260202103017
■006m o d
■007cr#unu||||||||
■020 ▼a9798286443659
■035 ▼a(MiAaPQ)AAI31843891
■040 ▼aMiAaPQ▼cMiAaPQ
■0820 ▼a530
■1001 ▼aPan, Shuhang.
■24510▼aFabrication and Characterization of Chalcogenide and Oxide Thin Films
■260 ▼a[Sl]▼bYale University▼c2025
■260 1▼aAnn Arbor▼bProQuest Dissertations & Theses▼c2025
■300 ▼a147 p
■500 ▼aSource: Dissertations Abstracts International, Volume: 86-12, Section: B.
■500 ▼aAdvisor: Ahn, Charles.
■5021 ▼aThesis (Ph.D.)--Yale University, 2025.
■520 ▼aThis dissertation explores the fabrication, structural characterization, and quantum transport properties of chalcogenide and oxide thin films. High-quality SnTe films were synthesized via molecular beam epitaxy (MBE), demonstrating tunable topological surface states through nanoscale patterning. Magnetoconductivity measurements revealed weak antilocalization (WAL) effects across continuous and patterned films, with coherence lengths governed by boundary scattering in hole-patterned geometries. Advanced focused ion beam (FIB) protocols enabled atomic-resolution transmission electron microscopy (TEM) of monolayer ZrO2 on silicon, defect distribution in off-stoichiometric CaWO4 films and orientation analysis in YVO4 thin films. Josephson junctions fabricated on superconducting Nd1−xEuxNiO2 thin films exhibited macroscopic quantum transport behavior. By integrating nanofabrication with multi-scale characterization, this work establishes design principles for investigating quantum phenomena in low-dimensional systems, advancing applications in topological electronics and superconducting devices.
■590 ▼aSchool code: 0265.
■650 4▼aCondensed matter physics
■650 4▼aMolecular physics
■650 4▼aPhysics
■650 4▼aNanoscience
■653 ▼aChalcogenide thin film
■653 ▼aNanofabrication
■653 ▼aOxide thin film
■653 ▼aTransmission electron microscopy
■653 ▼aTopological crystalline insulator
■690 ▼a0611
■690 ▼a0565
■690 ▼a0605
■690 ▼a0609
■71020▼aYale University▼bPhysics.
■7730 ▼tDissertations Abstracts International▼g86-12B.
■790 ▼a0265
■791 ▼aPh.D.
■792 ▼a2025
■793 ▼aEnglish
■85640▼uhttp://www.riss.kr/pdu/ddodLink.do?id=T17356687▼nKERIS▼z이 자료의 원문은 한국교육학술정보원에서 제공합니다.
