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Physics Based Modeling of Emerging Ferroelectric Devices and Performance Benchmarking of Memory Circuits
Physics Based Modeling of Emerging Ferroelectric Devices and Performance Benchmarking of M...
Physics Based Modeling of Emerging Ferroelectric Devices and Performance Benchmarking of Memory Circuits

상세정보

자료유형  
 학위논문 서양
최종처리일시  
20260202105601
ISBN  
9798265403445
DDC  
620
저자명  
Adnaan, Mohammad.
서명/저자  
Physics Based Modeling of Emerging Ferroelectric Devices and Performance Benchmarking of Memory Circuits
발행사항  
[Sl] : Georgia Institute of Technology, 2024
발행사항  
Ann Arbor : ProQuest Dissertations & Theses, 2024
형태사항  
131 p
주기사항  
Source: Dissertations Abstracts International, Volume: 87-05, Section: B.
주기사항  
Advisor: Naeemi, Azad J.
학위논문주기  
Thesis (Ph.D.)--Georgia Institute of Technology, 2024.
초록/해제  
요약Ferroelectric materials have recently demonstrated significant potential in low-energy non-volatile memory and neuromorphic computing applications. Their compatibility with existing CMOS technology has further heightened interest from both researchers and industry, leading to increased investment in ferroelectric process technologies. This dissertation aims to develop a comprehensive framework for the performance analysis of ferroelectricbased memory systems, encompassing from device modeling to system-level analysis. Initially, a computationally efficient phase-field physics-based compact model for ferroelectric capacitors is developed. The model self-consistently solves the time-dependent LandauGinzburg (TDGL) and Poisson's equations to capture polarization dynamics. Analytical expressions for the time-dependent kinetic coefficient and voltage-dependent gradient energy coefficient are derived; both of which are crucial for accurately modeling the transient characteristics of ferroelectric capacitors. This framework is subsequently extended for ferroelectric, antiferroelectric, and dielectric mixed phase capacitors based on Kittel's two sublattice theory. It enables the model to capture endurance effects due to phase evolution during cycling and the effect of depolarization field due to the presence of dielectric phases. The developed models are calibrated with the experimental results for low switching voltage (1V) ferroelectric material such as HfZrO2 and BaTiO3 for circuit level analysis. A comprehensive analysis is conducted on one transistor one capacitor (1T1C) ferroelectric random access memory (FERAM) circuit arrays, examining the impact of various design parameters. The performance of these memory arrays is compared to other competing memory technologies, particularly magnetic memories, in terms of read/write latency and energy consumption. Finally, the dissertation discusses a framework for system level analysis under real workloads, exploring the potential of using FERAM as main memory. It also examines how system performance can be optimized by selecting ferroelectric capacitors with optimal polarization switching voltages.
일반주제명  
Circuits
일반주제명  
Random access memory
일반주제명  
Transistors
일반주제명  
Energy consumption
일반주제명  
Ferroelectrics
일반주제명  
Electric fields
일반주제명  
Computer science
일반주제명  
Electrical engineering
일반주제명  
Electromagnetics
기타저자  
Georgia Institute of Technology.
기본자료저록  
Dissertations Abstracts International. 87-05B.
전자적 위치 및 접속  
로그인 후 원문을 볼 수 있습니다.

MARC

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■00520260202105601
■006m          o    d                
■007cr#unu||||||||
■020    ▼a9798265403445
■035    ▼a(MiAaPQ)AAI32315980
■035    ▼a(MiAaPQ)GeorgiaTech76922
■040    ▼aMiAaPQ▼cMiAaPQ
■0820  ▼a620
■1001  ▼aAdnaan,  Mohammad.
■24510▼aPhysics  Based  Modeling  of  Emerging  Ferroelectric  Devices  and  Performance  Benchmarking  of  Memory  Circuits
■260    ▼a[Sl]▼bGeorgia  Institute  of  Technology▼c2024
■260  1▼aAnn  Arbor▼bProQuest  Dissertations  &  Theses▼c2024
■300    ▼a131  p
■500    ▼aSource:  Dissertations  Abstracts  International,  Volume:  87-05,  Section:  B.
■500    ▼aAdvisor:  Naeemi,  Azad  J.
■5021  ▼aThesis  (Ph.D.)--Georgia  Institute  of  Technology,  2024.
■520    ▼aFerroelectric  materials  have  recently  demonstrated  significant  potential  in  low-energy  non-volatile  memory  and  neuromorphic  computing  applications.  Their  compatibility  with  existing  CMOS  technology  has  further  heightened  interest  from  both  researchers  and  industry,  leading  to  increased  investment  in  ferroelectric  process  technologies.  This  dissertation  aims  to  develop  a  comprehensive  framework  for  the  performance  analysis  of  ferroelectricbased  memory  systems,  encompassing  from  device  modeling  to  system-level  analysis.  Initially,  a  computationally  efficient  phase-field  physics-based  compact  model  for  ferroelectric  capacitors  is  developed.  The  model  self-consistently  solves  the  time-dependent  LandauGinzburg  (TDGL)  and  Poisson's  equations  to  capture  polarization  dynamics.  Analytical  expressions  for  the  time-dependent  kinetic  coefficient  and  voltage-dependent  gradient  energy  coefficient  are  derived;  both  of  which  are  crucial  for  accurately  modeling  the  transient  characteristics  of  ferroelectric  capacitors.  This  framework  is  subsequently  extended  for  ferroelectric,  antiferroelectric,  and  dielectric  mixed  phase  capacitors  based  on  Kittel's  two  sublattice  theory.  It  enables  the  model  to  capture  endurance  effects  due  to  phase  evolution  during  cycling  and  the  effect  of  depolarization  field  due  to  the  presence  of  dielectric  phases.  The  developed  models  are  calibrated  with  the  experimental  results  for  low  switching  voltage  (1V)  ferroelectric  material  such  as  HfZrO2  and  BaTiO3  for  circuit  level  analysis.  A  comprehensive  analysis  is  conducted  on  one  transistor  one  capacitor  (1T1C)  ferroelectric  random  access  memory  (FERAM)  circuit  arrays,  examining  the  impact  of  various  design  parameters.  The  performance  of  these  memory  arrays  is  compared  to  other  competing  memory  technologies,  particularly  magnetic  memories,  in  terms  of  read/write  latency  and  energy  consumption.  Finally,  the  dissertation  discusses  a  framework  for  system  level  analysis  under  real  workloads,  exploring  the  potential  of  using  FERAM  as  main  memory.  It  also  examines  how  system  performance  can  be  optimized  by  selecting  ferroelectric  capacitors  with  optimal  polarization  switching  voltages.
■590    ▼aSchool  code:  0078.
■650  4▼aCircuits
■650  4▼aRandom  access  memory
■650  4▼aTransistors
■650  4▼aEnergy  consumption
■650  4▼aFerroelectrics
■650  4▼aElectric  fields
■650  4▼aComputer  science
■650  4▼aElectrical  engineering
■650  4▼aElectromagnetics
■690    ▼a0800
■690    ▼a0984
■690    ▼a0544
■690    ▼a0607
■71020▼aGeorgia  Institute  of  Technology.
■7730  ▼tDissertations  Abstracts  International▼g87-05B.
■790    ▼a0078
■791    ▼aPh.D.
■792    ▼a2024
■793    ▼aEnglish
■85640▼uhttp://www.riss.kr/pdu/ddodLink.do?id=T17360652▼nKERIS▼z이  자료의  원문은  한국교육학술정보원에서  제공합니다.

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