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Physics Based Modeling of Emerging Ferroelectric Devices and Performance Benchmarking of Memory Circuits
Physics Based Modeling of Emerging Ferroelectric Devices and Performance Benchmarking of Memory Circuits
상세정보
- 자료유형
- 학위논문 서양
- 최종처리일시
- 20260202105601
- ISBN
- 9798265403445
- DDC
- 620
- 서명/저자
- Physics Based Modeling of Emerging Ferroelectric Devices and Performance Benchmarking of Memory Circuits
- 발행사항
- [Sl] : Georgia Institute of Technology, 2024
- 발행사항
- Ann Arbor : ProQuest Dissertations & Theses, 2024
- 형태사항
- 131 p
- 주기사항
- Source: Dissertations Abstracts International, Volume: 87-05, Section: B.
- 주기사항
- Advisor: Naeemi, Azad J.
- 학위논문주기
- Thesis (Ph.D.)--Georgia Institute of Technology, 2024.
- 초록/해제
- 요약Ferroelectric materials have recently demonstrated significant potential in low-energy non-volatile memory and neuromorphic computing applications. Their compatibility with existing CMOS technology has further heightened interest from both researchers and industry, leading to increased investment in ferroelectric process technologies. This dissertation aims to develop a comprehensive framework for the performance analysis of ferroelectricbased memory systems, encompassing from device modeling to system-level analysis. Initially, a computationally efficient phase-field physics-based compact model for ferroelectric capacitors is developed. The model self-consistently solves the time-dependent LandauGinzburg (TDGL) and Poisson's equations to capture polarization dynamics. Analytical expressions for the time-dependent kinetic coefficient and voltage-dependent gradient energy coefficient are derived; both of which are crucial for accurately modeling the transient characteristics of ferroelectric capacitors. This framework is subsequently extended for ferroelectric, antiferroelectric, and dielectric mixed phase capacitors based on Kittel's two sublattice theory. It enables the model to capture endurance effects due to phase evolution during cycling and the effect of depolarization field due to the presence of dielectric phases. The developed models are calibrated with the experimental results for low switching voltage (1V) ferroelectric material such as HfZrO2 and BaTiO3 for circuit level analysis. A comprehensive analysis is conducted on one transistor one capacitor (1T1C) ferroelectric random access memory (FERAM) circuit arrays, examining the impact of various design parameters. The performance of these memory arrays is compared to other competing memory technologies, particularly magnetic memories, in terms of read/write latency and energy consumption. Finally, the dissertation discusses a framework for system level analysis under real workloads, exploring the potential of using FERAM as main memory. It also examines how system performance can be optimized by selecting ferroelectric capacitors with optimal polarization switching voltages.
- 일반주제명
- Circuits
- 일반주제명
- Random access memory
- 일반주제명
- Transistors
- 일반주제명
- Energy consumption
- 일반주제명
- Ferroelectrics
- 일반주제명
- Electric fields
- 일반주제명
- Computer science
- 일반주제명
- Electrical engineering
- 일반주제명
- Electromagnetics
- 기본자료저록
- Dissertations Abstracts International. 87-05B.
- 전자적 위치 및 접속
- 로그인 후 원문을 볼 수 있습니다.
MARC
008260126s2024 us c eng d■001000017360652
■00520260202105601
■006m o d
■007cr#unu||||||||
■020 ▼a9798265403445
■035 ▼a(MiAaPQ)AAI32315980
■035 ▼a(MiAaPQ)GeorgiaTech76922
■040 ▼aMiAaPQ▼cMiAaPQ
■0820 ▼a620
■1001 ▼aAdnaan, Mohammad.
■24510▼aPhysics Based Modeling of Emerging Ferroelectric Devices and Performance Benchmarking of Memory Circuits
■260 ▼a[Sl]▼bGeorgia Institute of Technology▼c2024
■260 1▼aAnn Arbor▼bProQuest Dissertations & Theses▼c2024
■300 ▼a131 p
■500 ▼aSource: Dissertations Abstracts International, Volume: 87-05, Section: B.
■500 ▼aAdvisor: Naeemi, Azad J.
■5021 ▼aThesis (Ph.D.)--Georgia Institute of Technology, 2024.
■520 ▼aFerroelectric materials have recently demonstrated significant potential in low-energy non-volatile memory and neuromorphic computing applications. Their compatibility with existing CMOS technology has further heightened interest from both researchers and industry, leading to increased investment in ferroelectric process technologies. This dissertation aims to develop a comprehensive framework for the performance analysis of ferroelectricbased memory systems, encompassing from device modeling to system-level analysis. Initially, a computationally efficient phase-field physics-based compact model for ferroelectric capacitors is developed. The model self-consistently solves the time-dependent LandauGinzburg (TDGL) and Poisson's equations to capture polarization dynamics. Analytical expressions for the time-dependent kinetic coefficient and voltage-dependent gradient energy coefficient are derived; both of which are crucial for accurately modeling the transient characteristics of ferroelectric capacitors. This framework is subsequently extended for ferroelectric, antiferroelectric, and dielectric mixed phase capacitors based on Kittel's two sublattice theory. It enables the model to capture endurance effects due to phase evolution during cycling and the effect of depolarization field due to the presence of dielectric phases. The developed models are calibrated with the experimental results for low switching voltage (1V) ferroelectric material such as HfZrO2 and BaTiO3 for circuit level analysis. A comprehensive analysis is conducted on one transistor one capacitor (1T1C) ferroelectric random access memory (FERAM) circuit arrays, examining the impact of various design parameters. The performance of these memory arrays is compared to other competing memory technologies, particularly magnetic memories, in terms of read/write latency and energy consumption. Finally, the dissertation discusses a framework for system level analysis under real workloads, exploring the potential of using FERAM as main memory. It also examines how system performance can be optimized by selecting ferroelectric capacitors with optimal polarization switching voltages.
■590 ▼aSchool code: 0078.
■650 4▼aCircuits
■650 4▼aRandom access memory
■650 4▼aTransistors
■650 4▼aEnergy consumption
■650 4▼aFerroelectrics
■650 4▼aElectric fields
■650 4▼aComputer science
■650 4▼aElectrical engineering
■650 4▼aElectromagnetics
■690 ▼a0800
■690 ▼a0984
■690 ▼a0544
■690 ▼a0607
■71020▼aGeorgia Institute of Technology.
■7730 ▼tDissertations Abstracts International▼g87-05B.
■790 ▼a0078
■791 ▼aPh.D.
■792 ▼a2024
■793 ▼aEnglish
■85640▼uhttp://www.riss.kr/pdu/ddodLink.do?id=T17360652▼nKERIS▼z이 자료의 원문은 한국교육학술정보원에서 제공합니다.


