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Cryogenic Electron Microscopy Approaches to Nanoscale Characterization of Beam-Sensitive Materials
Cryogenic Electron Microscopy Approaches to Nanoscale Characterization of Beam-Sensitive Materials
Detailed Information
- 자료유형
- 학위논문 서양
- 최종처리일시
- 20260202105153
- ISBN
- 9798273309449
- DDC
- 530
- 서명/저자
- Cryogenic Electron Microscopy Approaches to Nanoscale Characterization of Beam-Sensitive Materials
- 발행사항
- [Sl] : Cornell University, 2025
- 발행사항
- Ann Arbor : ProQuest Dissertations & Theses, 2025
- 형태사항
- 167 p
- 주기사항
- Source: Dissertations Abstracts International, Volume: 87-07, Section: B.
- 주기사항
- Advisor: Muller, David.
- 학위논문주기
- Thesis (Ph.D.)--Cornell University, 2025.
- 초록/해제
- 요약Cryogenic electron microscopy enables structural and spectroscopic characterization of beam-sensitive materials that are otherwise unstable under conventional imaging conditions. Many functional interfaces in energy and environmental systems, such as solid-electrolyte interphases in lithium batteries, ionomer films in fuel cells, and pigment-binder matrices in cultural heritage materials, are chemically reactive, physically volatile, or highly susceptible to radiolysis and contamination. Cryogenic workflows preserve these systems in vitrified or low-temperature states, allowing transmission electron microscopy (TEM), scanning TEM (STEM), and electron energy-loss spectroscopy (EELS) to operate within safe dose limits while maintaining access to nanoscale structural and chemical detail. This thesis applies cryo-TEM, cryo-STEM, cryo-EELS, and cryo-focused ion beam (cryo-FIB) milling to enable nanoscale characterization across a range of beam-sensitive energy materials. A dimensionality reduction framework is developed to extract chemically meaningful information from low-signal STEM-EELS datasets, allowing multilayered interphases at lithium-metal interfaces to be spatially resolved. In alkaline fuel-cell catalyst layers, cryogenic imaging distinguishes ionomer from carbon support and identifies contamination artifacts that arise at room-temperature. Film thickness and coverage are quantified as functions of deposition method and solvent formulation. In historical CdS-based pigments, cryo-STEM imaging reveals stacking disorder in individual nanocrystals, and density functional theory (DFT) modeling shows how such disorder modulates exciton behavior and promotes degradation under illumination. Across all three systems, cryogenic electron microscopy extends the analytical reach of electron imaging and spectroscopy into materials that would otherwise degrade, transform, or contaminate during preparation and acquisition. The techniques demonstrated here enable direct measurement of chemical bonding, structural order, and interface morphology in complex, radiation-sensitive systems. Together, these studies establish cryo-EM as a versatile platform for nanoscale characterization of reactive soft matter, with implications for electrochemical performance, materials stability, and long-term degradation across both modern energy devices and historical materials.
- 일반주제명
- Applied physics
- 일반주제명
- Alternative energy
- 일반주제명
- Electrical engineering
- 기타저자
- Cornell University Applied Physics
- 기본자료저록
- Dissertations Abstracts International. 87-07B.
- 전자적 위치 및 접속
- 로그인 후 원문을 볼 수 있습니다.
MARC
008260126s2025 us c eng d■001000017359660
■00520260202105153
■006m o d
■007cr#unu||||||||
■020 ▼a9798273309449
■035 ▼a(MiAaPQ)AAI32242699
■040 ▼aMiAaPQ▼cMiAaPQ
■0820 ▼a530
■1001 ▼aColletta, Michael.
■24510▼aCryogenic Electron Microscopy Approaches to Nanoscale Characterization of Beam-Sensitive Materials
■260 ▼a[Sl]▼bCornell University▼c2025
■260 1▼aAnn Arbor▼bProQuest Dissertations & Theses▼c2025
■300 ▼a167 p
■500 ▼aSource: Dissertations Abstracts International, Volume: 87-07, Section: B.
■500 ▼aAdvisor: Muller, David.
■5021 ▼aThesis (Ph.D.)--Cornell University, 2025.
■520 ▼aCryogenic electron microscopy enables structural and spectroscopic characterization of beam-sensitive materials that are otherwise unstable under conventional imaging conditions. Many functional interfaces in energy and environmental systems, such as solid-electrolyte interphases in lithium batteries, ionomer films in fuel cells, and pigment-binder matrices in cultural heritage materials, are chemically reactive, physically volatile, or highly susceptible to radiolysis and contamination. Cryogenic workflows preserve these systems in vitrified or low-temperature states, allowing transmission electron microscopy (TEM), scanning TEM (STEM), and electron energy-loss spectroscopy (EELS) to operate within safe dose limits while maintaining access to nanoscale structural and chemical detail. This thesis applies cryo-TEM, cryo-STEM, cryo-EELS, and cryo-focused ion beam (cryo-FIB) milling to enable nanoscale characterization across a range of beam-sensitive energy materials. A dimensionality reduction framework is developed to extract chemically meaningful information from low-signal STEM-EELS datasets, allowing multilayered interphases at lithium-metal interfaces to be spatially resolved. In alkaline fuel-cell catalyst layers, cryogenic imaging distinguishes ionomer from carbon support and identifies contamination artifacts that arise at room-temperature. Film thickness and coverage are quantified as functions of deposition method and solvent formulation. In historical CdS-based pigments, cryo-STEM imaging reveals stacking disorder in individual nanocrystals, and density functional theory (DFT) modeling shows how such disorder modulates exciton behavior and promotes degradation under illumination. Across all three systems, cryogenic electron microscopy extends the analytical reach of electron imaging and spectroscopy into materials that would otherwise degrade, transform, or contaminate during preparation and acquisition. The techniques demonstrated here enable direct measurement of chemical bonding, structural order, and interface morphology in complex, radiation-sensitive systems. Together, these studies establish cryo-EM as a versatile platform for nanoscale characterization of reactive soft matter, with implications for electrochemical performance, materials stability, and long-term degradation across both modern energy devices and historical materials.
■590 ▼aSchool code: 0058.
■650 4▼aApplied physics
■650 4▼aAlternative energy
■650 4▼aElectrical engineering
■653 ▼aBeam sensitive materials
■653 ▼aElectron energy loss spectroscopy
■653 ▼aElectron microscopy
■653 ▼aRenewable energy materials
■690 ▼a0215
■690 ▼a0544
■690 ▼a0363
■71020▼aCornell University▼bApplied Physics.
■7730 ▼tDissertations Abstracts International▼g87-07B.
■790 ▼a0058
■791 ▼aPh.D.
■792 ▼a2025
■793 ▼aEnglish
■85640▼uhttp://www.riss.kr/pdu/ddodLink.do?id=T17359660▼nKERIS▼z이 자료의 원문은 한국교육학술정보원에서 제공합니다.
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