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3 Results:SS:ELECTRONENERGYLOSSSPECTROSCOPY 0.46 sec.
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Cryogenic Electron Microscopy Approaches to Nanoscale Characterization of Beam-Sensitive Materials
Cryogenic Electron Microscopy Approaches to Nanoscale Characterization of Beam-Sensitive Materials
Colletta, Michael. | Cornell University | 2025
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Nanoscale Investigations of Monolayer Thin Films and Heavy Element Materials
Nanoscale Investigations of Monolayer Thin Films and Heavy Element Materials
Kang, Ruizhe. | Harvard University | 2024
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3
Fabrication and Characterization of Atomic Level Defects in hBN Using Electron and Ion Beam Microscopes
Fabrication and Characterization of Atomic Level Defects in hBN Using Electron and Ion Beam Microscopes
Byrne, Dana Orion. | University of California, Berkeley | 2025
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